Vyroubal P, Maxa J, Neděla V, Jirák J, Hladká K. Apertures with Laval Nozzle and Circular Orifice in Secondary Electron Detector for Environmental Scanning Electron Microscope. AiMT [Internet]. 2022 Feb. 18 [cited 2024 Nov. 21];8(1):59-6. Available from: https://aimt.cz/index.php/aimt/article/view/1573